Publications in Peer-Reviewed Journals (18)
| 2022 | Predicting the adhesion strength of micropatterned surfaces using supervised machine learning Materials Today 53 Samri, M., Thiemecke, J., Prinz, E., Dahmen, T., Hensel, R., Arzt, E., pp. 41-50, (2022) |
| 2021 | Deep Neural Networks for Analysis of Microscopy Images—Synthetic Data Generation and Adaptive Sampling. Trampert, P., Rubinstein, D., Boughorbel, F., Schlinkmann, C., Luschkova, M., Slusallek, |
| 2021 | Neuroscope: An explainable ai toolbox for semantic segmentation and image classification of convolutional neural nets Applied Sciences 11 (5) Schorr, C., Goodarzi, P., Chen, F., Dahmen, T. , 2199 (2021) |
| 2020 | A GPU-based caching strategy for multi- material linear elastic FEM on regular grids. Schlinkmann, C., Roland, M., Wolff, C., Trampert, P., Slusallek, P., Diebels, S. & Dahmen, T. A, PLOS One, doi: 10.1371/journal.pone.0240813 (2020) |
| 2020 | Sparse Scanning Electron Microscopy Data Acquisition and Deep Neural Networks for Automated Segmentation in Connectomics. Potocek, P., Trampert, P., Peemen, M., Schoenmakers, R., & Dahmen, T., Microscopy and Microanalysis, 26 (3), pp. 403-412 (2020) |
| 2019 | Digital reality: a model-based approach to supervised learning from synthetic data. Dahmen, T., Trampert, P., Boughorbel, F., Sprenger, J., Klusch, M., Fischer, K., Kübel, C. &, Slusallek, P., AI Perspectives 1 (1), pp. 1-12 (2019) |
| 2018 | Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography. Trampert, P., Wang, W., Chen, D., Ravelli, RBG, Dahmen, T., Peters, JP., Kübel, C. & Slusallek, P., Ultramicroscopy 191, pp. 1-10 (2018) |
| 2018 | How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality? Trampert, P., Bourghorbel, F., Potocek, P., Peemen, M., Schlinkmann, C., Dahmen, T. & Slusallek, P., Ultramicroscopy 191, pp. 11-17 (2018) |
| 2018 | Linear chains of HER2 receptors found in the plasma membrane using liquidphase Electron microscopy. Parker, K., Trampert, P., Tinnemann, V., Peckys, D., Dahmen, T. & de Jonge, N., Biophysical journal 115 (3), pp. 503-513 (2018) |
| 2018 | Personalized Orthopedic Trauma Surgery by Applied Clinical Mechanics Roland, M., Tjardes, T., Dahmen, T., Slusallek, P., Bouillon, B. & Diebels, S., in: Biomedical Technology, pp. 313-331 (2018) |
| 2017 | Modelling and characterization of ductile fracture surface in Al-Si alloys by means of Voronoi tessellation. Kruglova, A., Roland, M., Diebels, S., Dahmen, T., Slusallek, P. & Mücklich, F., Materials Characterization, 131, pp. 1-11 (2017) |
| 2017 | Spherically symmetric volume elements as basis functions for image reconstructions in computed laminography. Trampert, P., Vogelgesang, J., Schorr, C., Maisl, M., Bogachev, S., Marniok, N. Louis, A., Dahmen, T. & Slusallek, P., Journal of X-Ray Science and Technology, 25 (4), pp. 533-546 (2017) |
| 2016 | Advanced recording schemes for electron tomography. Dahmen, T., Trampert, P., de Jonge, N. & Slusallek, P., MRS Bulletin 41(7) pp. 537-541 (2016) |
| 2016 | Feature Adaptive Sampling for Scanning Electron Microscopy. Scientific Reports (Nature Publishing Group) Dahmen, T., Engstler, M., Pauly, C., Trampert, P., de Jonge, N., Mücklich, F. & Slusallek, P., 6 25350 (2016) |
| 2015 | An automated workflow for the biomechanical simulation of a tibia with implant using computed tomography and the finite element method. Dahmen, T., Roland, M., Tjardes, T., Bouillon B., Slusallek, P. & Diebels S., Comput. Math. with Appl. 70 (5) pp. 903-916 (2015) |
| 2015 | Marker detection in Electron Tomography: A comparative study. Trampert, P., Bogatchev, S., Marniok, N., Dahmen, T. & Slusallek, P. (2015), Microsc. Microanal. 21(6) pp. 1591-1601 (2015) |
| 2015 | Matched Backprojection Operator for the Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. Dahmen, T., Kohr, K., de Jonge, N. & Slusallek, P., Microsc. Microanal. 21(03) pp. 725-738 (2015) |
| 2015 | The Ettention Software Package. Dahmen, T., Marsalek, L., Marniok, N., Turonova, B., Bogatchev, S., Tramper P. & Slusallek, P., Ultramicroscopy 161 pp. 110-118 (2015) |
| 2014 | Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. Dahmen, T., Baudoin, J.P., Andrew, L., Kuebel, Slusallek, P. & de Jonge N., Microsc. Microanal. 20 (2) pp. 548-60 (2014) |
| 2014 | Less than full circumferential fusion of a tibial nonunion is sufficient to achieve mechanically valid fusion - Proof of concept using a finite element modeling approach. Tjardes, T., Roland, M., Otchwemah, R., Dahmen, T., Diebels, S. & Bouillon, B., BMC Musculoskeletal Disorders 15 pp. 434 (2014) |
Publications in Conference Proceedings (22)
| 2022 | Towards Visual Programming Image Processing in Jupyter Notebooks Chen, F., Slusallek, P., M¨uller, M., Dahmen, T. Chaldene, 2022 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC), pp. 1-3 (2022) |
| 2021 | Synthetic training data generation for deep learning based quality inspection Gutierrez, P., Luschkova, M., Cordier, A., Shukor, M., Schappert, M., Dahmen, T., SPIE Fifteenth International Conference on Quality Control by Artificial Vision, 11794, pp. 9-16 (2021) |
| 2020 | Advances in Sparse and Adaptive Scanning Electron Microscopy Dahmen, T., Gordon Research Conference on Liquid Phase Electron Microscopy, Jan. 26-31, Lucca (Barga), Italy (2020) |
| 2020 | Sparse scanning electron microscopy data acquisition and deep neural networks for automated segmentation in connectomics Potocek, P., Trampert, P., Peemen, M., Schoenmakers, R. & Dahmen, T., Microscopy and Microanalysis 26 (3), 403-412, (2020) |
| 2019 | An adaptive sparse sampling scheme for scanning electron microscopy using Delauney triangulation Dahmen, T. & Trampert, P., Microscopy and Microanalysis 25 (S2), pp. 154-155 (2019) |
| 2019 | Application of Missing Wedge Inpainting in Material Science. Trampert, P., Dahmen, T. & Slusallek, P., Microscopy and Microanalysis 25 (S2), pp. 440-441 (2019) |
| 2019 | Sparse and Adaptive Sampling in Scanning Electron Microscopy. Dahmen, T. & Trampert, P., Microscopy and Microanalysis 25 (S1), pp. 29-30 (2019) |
| 2018 | Blob-based Algebraic Reconstruction Technique for Computed Laminography Dahmen, T., Trampert, P. & Slusallek, P., Microscopy and Microanalysis 24 (S1), pp. 994-995 (2018) |
| 2018 | Deep learning for sparse scanning electron microscopy Trampert, P., Schlabach, S., Dahmen, T. & Slusallek, P., Microscopy and Microanalysis 25 (S2), pp. 158-159 (2018) |
| 2018 | Exemplar-based inpainting based on dictionary learning for sparse scanning electron microscopy Trampert, P., Schlabach, S., Dahmen, T. & Slusallek, P., Microscopy and Microanalysis 24 (S1), pp. 700-701 Winner of Presidential Scholar Award (2018) |
| 2018 | Fact or Fiction: Maximal Image Quality with Minimal Dwell Time Trampert, P. Dahmen, T. & Slusallek, P., Microscopy and Microanalysis 24 (S1), pp. 480-481 (2018) |
| 2018 | Sparse scanning electron microscopy and deep learning for imaging and segmentation of neuron structures Dahmen, T., Potocek, P., Trampert, P., Peemen, M. & Schoenmakers, R., Microscopy and Microanalysis 25 (S2), pp. 196-197 (2018) |
| 2018 | Sparse scanning electron microscopy for imaging and segmentation in connectomics Potocek, P., Schoenmakers, R., Trampert, P., Dahmen, T. & Peemen, M., IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2018), pp. 2461-2465 (2018) |
| 2016 | Comparative Study of Three Marker Detection Algorithms in Electron Tomography. Trampert, P., Bogatchev, S., Marniok, N., Dahmen, T. & Slusallek P., Microscopy and Microanalysis 22 (S3), pp. 1044-1045 (2016) |
| 2016 | Dictionary-based Filling of the Missing Wedge in Electron Tomography. Trampert, P., Chen, D., Bogatchev, S. Dahmen, T. & Slusallek P., Microscopy and Microanalysis 22 (S3), pp. 554-555 (2016) |
| 2016 | ”Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy. Dahmen, T., Engstler, M., Pauly, C., Trampert, P., de Jonge, N., Mücklich, F. & Slusallek, P., Microscopy and Microanalysis 22 (S3), pp. 632-633 (2016) |
| 2015 | Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy: TFS 3D STEM. Dahmen, T., Baudoin, J.P., Andrew, L., Kuebel, C., Slusallek, P. & de Jonge N., 18th Intern. Microscopy Congress, Sep. 7-12, Prague (2015) |
| 2015 | Ettention: building blocks for iterative reconstruction algorithms. Dahmen, T., Marsalek L., Marniok N., Turonova B., Bogachev S., Trampert P. Nickels S. & Slusallek P., Microscopy and Microanalysis 21 (S3), pp. 1601-1602 (2015) |
| 2015 | Optimized patient-specific implants. Roland, M., Dahmen, T., Tjardes, T., Otchwemah, R., Slusalleck, P. & Diebels, S., 11th World Congress on Computational Mechanics, Jul. 20-25, Barcelona (2015) |
| 2015 | Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy. Dahmen, T., Kohr H., de Jonge N. & Slusallek P., Microscopy and Microanalysis 21 (S3), pp. 2337-2338 Winner of Presidential Scholar Award (2015) |
| 2014 | TFS: Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy. Dahmen, T., Slusallek, P. & de Jonge, N., Microscopy and Microanalysis 20 (S3), pp. 786-787 (2014) |
| 2006 | Applying Ray Tracing for Virtual Reality and Industrial Design. Wald, I., Dietrich, A., Benthin, C., Efremov, A., Dahmen, T., Gunther, J., Havran, V., Seidel, H.P. & Slusallek, P., Proc. IEEE Symposium on Interactive Ray Tracing pp. 177-185 (2006) |
| 2004 | Realtime Ray Tracing for Current and Future Games. Schmittler, J., Pohl, D., Dahmen, T., Vogelgesang, C. & Slusallek P., Proc. of 34. Jahrestagung der Gesellschaft für Informatik (2004) |
| 2002 | Interactive headlight simulation: a case study of interactive distributed ray tracing. Benthin, C., Dahmen, T., Wald, I. & Slusallek P, Proc. Fourth Eurographics Workshop on Parallel Graphics and Visualization (2002) |
Patents (1)
| 2016 | Method and Device for Testing Samples by Means of an Electron or Ion Beam Microscope Dahmen, T. & de Jonge, N., US Patent Nr. 10 , 319 , 559 B2 (2016) |
| 2015 | Verfahren und Vorrichtung zur Untersuchung von Proben durch ein Elektronen- oder Ionenstrahlmikroskop Dahmen, T. & de Jonge, N., Deutsches Patent Nr. 10 2015 114 843.9 (2015) |
Other Publications (2)
| 2020 | Implantat nach Maß. Braun, BJ., Dahmen, T., Diebels, S., Roland, M & Tjardes, T., Management & Krankenhaus 12/2020, p. 13 (2020) |
| 2018 | Digitale Transformation in der Materialwissenschaft und Werkstofftechnik Sandfeld, S., Dahmen, T., Fischer, FOR, Eberl, C., Klein, S., Selzer, M., Müller, J., Mücklich, F., Engstler, M. Diebels, S., Tschuncky, R., Prakash, A., Steinberger, D., Kübel, C., Herrmann, HG, Schubotz, R., DGM Strategiepapier (2018) |
Selected Invited Talks and Presentations
| 2020 | Advances in Sparse and Adaptive Scanning Electron Microscopy Dahmen, T., 28. Jan. 2020, Gordon Research Conference on Liquid Phase Electron Microscopy, Lucca, Barga, Italy |
| 2020 | Deep Learning in MatWerk - Einführung und Anwendungen Dahmen, T., 24. Nov. 2020, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany |
| 2020 | Digital Reality - Supervised Learning From Synthetic Data Dahmen, T., 30. Mar. 2020, acatechWorkshop ”Machine Learning Kompetenzen in Deutschland stärken”, München, Deutschland |
