Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy: TFS 3D STEM.
by Tim, Dahmen
Dahmen, T., Baudoin, J.P., Andrew, L., Kuebel, C., Slusallek, P. & de Jonge N., 18th Intern. Microscopy Congress, Sep. 7-12, Prague (2015)
by Tim, Dahmen
Dahmen, T., Baudoin, J.P., Andrew, L., Kuebel, C., Slusallek, P. & de Jonge N., 18th Intern. Microscopy Congress, Sep. 7-12, Prague (2015)