”Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy.
by Tim, Dahmen
Dahmen, T., Engstler, M., Pauly, C., Trampert, P., de Jonge, N., Mücklich, F. & Slusallek, P., Microscopy and Microanalysis 22 (S3), pp. 632-633 (2016)