Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM
von Dagmar, Goll
U. Golla-Schindler, I. Wacker, B. Schindler, R. Loeffler, D. Goll, G. Schneider, R. Schröder; Microscopy and MicroAnalysis 27, Supplement S1, 3134-3136