Overview of publications Publications

299 publications found

Herbert Schneckenburger ISSN: 2642-5580,

Dominic Hohs, Gerhard Martinek, Ralf Loeffler, Dagmar Goll, Gerhard Schneider ISSN: 2158-3226,

Nebojša Nešić, Xavier Heiligenstein, Lydia Zopf, Valentin Blüml, Katharina S. Keuenhof, Michael Wagner, Johanna L. Höög, Heng Qi, Zhiyang Li, Georgios Tsaramirsis, Christopher J. Peddie, Miloš Stojmenović, Andreas Walter ISSN: 1059-910X,

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Leon Stütz, Lennart Kopp, Max Ludwig, Markus Kley

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Mahyar Mahinzaeim, Gen Qi Xu, Xiao Xuan Feng ISSN: 0044-2267,

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Kishansinh Rathod, Sankeerth Desapogu, Andreas Jansche, Timo Bernthaler, Gerhard Schneider, Daniel Braun, Stephan Diez ISSN: 1537-0755,

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Martin Fenker, Lisa-Marie Weinhold, Joachim Albrecht, Holger Kaßner ISSN: 2616-647X,

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Stefan Spannbauer, Gaby Ketzer-Raichle, Timo Bernthaler ISSN: 2195-8599,

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Matias Oscar Volman Stern, Dominic Hohs, Andreas Jansche, Timo Bernthaler, Gerhard Schneider ISSN: 2942-3899,

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Krawczyk Patrick, Gaertner Marvin, Jansche Andreas, Bernthaler Timo, Schneider Gerhard

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Overview of publications Publications

299 publications found

Adapting laser microscopy to life sciences

Analysis of the influence of abnormally grown grains on demagnetization behavior of FeNdB sintered magnets

Automated segmentation of cell organelles in volume electron microscopy using deep learning

Fundamentals for the Development and Testing of Electrical Contacts in the Electrified Drive System in the Area of Conflict between Increased Product Diversity and Higher Currents

The Riesz basisness of the eigenfunctions and eigenvectors connected to the stability problem of a fluid-conveying tube with boundary control

Nondestructive Defect Detection in 3D X-ray Microscopy Data of Ball Grid Array Solder for Void Detection in Solder Joints using Deep Learning

First optimization steps for the Nanocluster Synthesis of Platinum-Yttrium Alloys

Electrolytic etching of copper for grain size determination

Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function

Reducing artifact generation when using perceptual loss for image deblurring of microscopy data for microstructure analysis